Publications

Scientific Articles

Direct Imaging of a Two-Dimensional Silica Glass on Graphene
Nano Letters (2012)

Three-Dimensional Tracking and Visualization of Hundreds of Pt−Co Fuel Cell Nanocatalysts During Electrochemical Aging
Nano Letters (2012)

Atomic-Resolution Spectroscopic Imaging of Ensembles of Nanocatalyst Particles Across the Life of a Fuel Cell
Nano Letters (2011)

Networked and chiral nanocomposites from ABC triblock terpolymer coassembly with transition metal oxide nanoparticles
Journal of Materials Chemistry (2011)

Surfactant Ligand Removal and Rational Fabrication of Inorganically Connected Quantum Dots
Nano Letters (2011)  doi: 10.1021/nl1036116

Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy
Microscopy and Microanalysis (2011), 17: 75-80 doi: 10.1017/S1431927610094171

Controlled Synthesis of Uniform Cobalt Phosphide Hyperbranched Nanocrystals Using Tri-n-octylphosphine Oxide as a Phosphorus Source 
Nano Letters (2011), 11: 188-197 doi:10.1021/nl103400a

Deep Space Network Scheduling Using Evolutionary Computational Methods
IEEE Aerospace Conference 2007 paper #1210 (2007)

Analysis and Enhancement of Carding and Spinning
National Textile Center Annual Report: November 2003; NTC Project: F01-GT06

Conference Abstracts

Efficient Elastic Imaging of Single Atoms with Aberration‐Corrected Scanning Transmission Electron Microscopy, Microscopy and Microanalysis (2011)

 Cornell Spectrum Imager: Open Source Spectrum Analysis with ImageJ, Microscopy and Microanalysis (2011)

3‐D Tracking and Visualization of Hundreds of Fuel Cell Nanocatalysts During Electrochemical Aging, Microscopy and Microanalysis (2011)

Determining Resolution in an Aberration-Corrected Era: Why Your Probe Is Larger Than You Thought Microscopy and Microanalysis (2010), 16: 152-153, doi: 10.1017/S1431927610060319

Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning, Microscopy and Microanalysis (2010), 16: 1838-1839, doi: 10.1017/S1431927610060848

Three-dimensionally Networked Nanocomposites,  MRS Spring 2010


Electron Channeling Artifacts in Sub-Angstrom STEM Images, Cornell Engineering Research Conference, Feb. 2010

Excitation of Transverse Eigenstates in Si [211] with Swift Electrons, Gotham-Metro Condensed Matter Meeting, Nov 2009


Electron Channeling Artifacts in Silicon 211 Using Aberration-Corrected STEMMicroscopy and Microanalysis, Volume 15, Supplement S2, Jul 2009, pp 1492-1493, doi: 10.1017/S1431927609094896
Other Publications


To the Editor: An appeal to protect a tradition from going up in flames The Cornell Daily Sun, Opinion & Editorial, Mar 23, 2009

Talks

Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography, Semiconductor Research Corporation GRC Patterning Review, Nov. 2010


Atomic-Scale Chemical Reactions at Buried Interfaces in Copper/Low-K Interconnects, Semiconductor Research Corporation GRC Back End Processes and Packaging Review, Oct. 2010


Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning, Microscopy and Microanalysis 2010 Meeting, Aug. 2010


Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography, Semiconductor Research Corporation GRC Patterning Review, Nov. 2009